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Articles
In-depth technical articles on NFC and contactless measurement, contact (ISO/IEC 7816) testing and semiconductor production test — the standards, and how to test against them — openly published by the engineers who build the systems. No sign-up, no paywall.
One device, every card protocol — NFC and contact, built into the ci200
The ci200 implements ISO 14443, ISO 15693 and ISO 7816 natively in firmware — activate a card and exchange APDUs in two RCI commands, no middleware.
Read article →The ci200 on your desk — a developer-sized option for test engineers
A compact desktop ci200 with 2–4 channels — the same hardware, firmware and RCI API as the production rack, at a fraction of the cost.
One box, every test — the ci200's integrated measurement architecture
Digital functional, DC parametric, VNA and NFC test on every ci200 channel — one box, one firmware, one API, with sub-microsecond domain switching.
Integrate the ci200 your way —
introducing the RCI
The ci200 ships with the RCI: a JSON-over-TCP/IP remote control interface — automate it from Python, C#, JavaScript or LabVIEW with no drivers or SDKs.
How to test NFC without a sniffer antenna
What a spy or sniffer antenna does on an NFC test bench, why it loads the RF field — and how the ci230 decodes the protocol from its single test antenna.